LoongArch: Add crc tests

gcc/testsuite/ChangeLog:

	* g++.target/loongarch/crc.C: New test.
	* g++.target/loongarch/crc-scan.C: New test.
This commit is contained in:
Xi Ruoyao 2024-12-13 15:46:00 +08:00
parent 80491b0493
commit c5424185b0
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2 changed files with 133 additions and 0 deletions

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/* { dg-do compile } */
/* { dg-options "-O2 -march=loongarch64" } */
#include "crc.C"
/* { dg-final { scan-assembler-times "crc\\.w\\.b\\.w" 2 } } */
/* { dg-final { scan-assembler-times "crc\\.w\\.h\\.w" 2 } } */
/* { dg-final { scan-assembler-times "crc\\.w\\.w\\.w" 2 } } */
/* { dg-final { scan-assembler-times "crcc\\.w\\.b\\.w" 2 } } */
/* { dg-final { scan-assembler-times "crcc\\.w\\.h\\.w" 2 } } */
/* { dg-final { scan-assembler-times "crcc\\.w\\.w\\.w" 2 } } */
/* { dg-final { scan-assembler-not "crc\\.w\\.\[bhw\]\\.w\t\\\$r\[0-9\]+,\\\$r0" } } */
/* { dg-final { scan-assembler-not "crcc\\.w\\.\[bhw\]\\.w\t\\\$r\[0-9\]+,\\\$r0" } } */

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/* { dg-do run } */
/* { dg-options "-O2" } */
typedef __UINT8_TYPE__ uint8_t;
typedef __UINT16_TYPE__ uint16_t;
typedef __UINT32_TYPE__ uint32_t;
typedef __UINT64_TYPE__ uint64_t;
typedef __SIZE_TYPE__ size_t;
template <class T, uint32_t poly>
__attribute__ ((always_inline)) inline uint32_t
crc32_impl (const T *data, size_t len)
{
uint32_t ret = 0xffffffffu;
for (size_t k = 0; k < len; k++)
{
ret ^= data[k];
for (int i = 0; i < 8 * sizeof (T); i++)
if (ret & 1)
ret = (ret >> 1) ^ poly;
else
ret >>= 1;
}
return ret;
}
template <class T, uint32_t poly>
__attribute__ ((noipa, optimize (0))) uint32_t
crc32_ref (const T *data, size_t len)
{
return crc32_impl<T, poly> (data, len);
}
template <class T, uint32_t poly>
__attribute__ ((noipa)) uint32_t
crc32_opt (const T *data, size_t len)
{
return crc32_impl<T, poly> (data, len);
}
template <class T, uint32_t poly>
__attribute__ ((noipa)) uint32_t
crc32_alt (const T *data, size_t len)
{
uint32_t ret = 0xffffffffu;
for (size_t k = 0; k < len; k++)
{
T x = data[k];
for (int i = 0; i < 8 * sizeof (T); i++)
{
if ((ret & 1) ^ (x & 1))
ret = (ret >> 1) ^ poly;
else
ret >>= 1;
x >>= 1;
}
}
return ret;
}
union test_data_t
{
uint8_t u8[1024];
uint16_t u16[512];
uint32_t u32[256];
operator const uint8_t * () const { return u8; }
operator const uint16_t * () const { return u16; }
operator const uint32_t * () const { return u32; }
constexpr
test_data_t ()
: u8{}
{
}
};
/* Generate test data at compile time with minstd_rand0 algorithm. */
constexpr test_data_t
gen (uint64_t seed)
{
uint64_t state = seed;
test_data_t ret;
for (int i = 0; i < sizeof (ret); i++)
{
state = state * 16807 % 2147483647;
ret.u8[i] = (uint8_t)state;
}
return ret;
}
constexpr union test_data_t test_data = gen (0xdeadbeef);
void
assert_eq (uint32_t x, uint32_t y)
{
if (x != y)
__builtin_trap ();
}
template <class T, uint32_t poly>
void
test_crc32 ()
{
constexpr size_t len = sizeof (test_data) / sizeof (T);
uint32_t ref = crc32_ref<T, poly> (test_data, len);
assert_eq (ref, crc32_opt<T, poly> (test_data, len));
assert_eq (ref, crc32_alt<T, poly> (test_data, len));
}
int
main (void)
{
test_crc32<uint32_t, 0xEDB88320u> ();
test_crc32<uint16_t, 0xEDB88320u> ();
test_crc32<uint8_t, 0xEDB88320u> ();
test_crc32<uint32_t, 0x82F63B78u> ();
test_crc32<uint16_t, 0x82F63B78u> ();
test_crc32<uint8_t, 0x82F63B78u> ();
}